This repository contains software for the calculation of goodness-of-fit test statistics and their P-values. The three statistics computed are the Empirical Distribution function statistics called Cramer-von Mises, Anderson-Darling, and Watson statistics. The statistics and their P-values can be used to assess an assumed distribution.The following distributions are available: Uniform, Normal, Gamma, Logistic, Laplace, Weibull, Extreme Value, and Exponential.
Version: | 0.1.0 |
Depends: | R (≥ 3.5.0) |
Imports: | CompQuadForm (≥ 1.4.3), rmutil (≥ 1.1.5), stats |
Suggests: | knitr, rmarkdown, stringi, testthat (≥ 3.0.0) |
Published: | 2021-10-25 |
DOI: | 10.32614/CRAN.package.EDFtest |
Author: | Li Yao [aut, cre], Richard Lockhart [aut] |
Maintainer: | Li Yao <yaoliy at sfu.ca> |
BugReports: | https://github.com/LiYao-sfu/EDFtest/issues |
License: | MIT + file LICENSE |
NeedsCompilation: | no |
Materials: | README NEWS |
CRAN checks: | EDFtest results |
Reference manual: | EDFtest.pdf |
Vignettes: |
EDFtest-vignette |
Package source: | EDFtest_0.1.0.tar.gz |
Windows binaries: | r-devel: EDFtest_0.1.0.zip, r-release: EDFtest_0.1.0.zip, r-oldrel: EDFtest_0.1.0.zip |
macOS binaries: | r-release (arm64): EDFtest_0.1.0.tgz, r-oldrel (arm64): EDFtest_0.1.0.tgz, r-release (x86_64): EDFtest_0.1.0.tgz, r-oldrel (x86_64): EDFtest_0.1.0.tgz |
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