The Scott-Knott Effect Size Difference (ESD) test is a mean comparison approach that leverages a hierarchical clustering to partition the set of treatment means (e.g., means of variable importance scores, means of model performance) into statistically distinct groups with non-negligible difference [Tantithamthavorn et al., (2018) http://dx.doi.org/10.1109/TSE.2018.2794977]. It is an alternative approach of the Scott-Knott test that considers the magnitude of the difference (i.e., effect size) of treatment means with-in a group and between groups. Therefore, the Scott-Knott ESD test (v2.x) produces the ranking of treatment means while ensuring that (1) the magnitude of the difference for all of the treatments in each group is negligible; and (2) the magnitude of the difference of treatments between groups is non-negligible.
The mechanism of the Scott-Knott ESD test (v2.0.3) is made up of 2 steps:
Unlike the earlier version of the Scott-Knott ESD test (v1.x) that post-processes the groups that are produced by the Scott-Knott test, the Scott-Knott ESD test (v2.x) pre-processes the groups by merging pairs of statistically distinct groups that have a negligible difference.
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install.packages("ScottKnottESD")
install.packages("devtools")
::install_github("klainfo/ScottKnottESD", ref="development") devtools
library(ScottKnottESD)
# An example dataset: The 1,000 variable importance scores of 9 software metrics.
# The scores are generated by the Random Forests technique using 1,000 out-of-sample bootstrap.
example
<- sk_esd(example)
sk plot(sk)
<- sk_esd(maven)
sk plot(sk)
ScottKnottESD can be referenced as:
@article{tantithamthavorn2017mvt,
Author={Tantithamthavorn, Chakkrit and McIntosh, Shane and Hassan, Ahmed E. and Matsumoto, Kenichi},
Title = {An Empirical Comparison of Model Validation Techniques for Defect Prediction Models},
Booktitle = {IEEE Transactions on Software Engineering (TSE)},
Volumn = {43},
Number = {1},
page = {1-18},
Year = {2017}
}
@article{tantithamthavorn2018optimization,
Author={Tantithamthavorn, Chakkrit and McIntosh, Shane and Hassan, Ahmed E. and Matsumoto, Kenichi},
Title = {The Impact of Automated Parameter Optimization for Defect Prediction Models},
Booktitle = {IEEE Transactions on Software Engineering (TSE)},
page = {Early Access},
Year = {2018} }